Professor Burnham's expertise lies in the use of Atomic Force Microscopy (AFM) for topographical, mechanical, electrical, and chemical measurements at the nanoscale; see her Google Scholar profile for details. She teaches AFM courses at WPI and ETH Zürich. Her courses are based on the videos at the AtomicForceMicro YouTube site. She is ( v...e...r...y s...l...o...w...l...y...! ) working on an accompanying textbook.
The UFC-Lab hosts an AFM optimized for teaching. It acquires topographic images in static, dynamic, and phase-contrast modes. It also collects force curves. Furthermore, there are other AFMs on campus with a wider selection of modes and capabilities. Professor Burnham is willing to discuss the best approach to your project, should you need other options.