USPTO Quality Metrics Analysis


Olivia S. Bennett, Elora V. Borkowski, Arthur J. Fulgoni, Andrew J. Weiler


United States Patent and Trademark Office


James Hanlan, Paul Davis


October – December 2014

Project Outcomes

Final Report


The United States Patent and Trademark Office is working to improve its position as a “world-class” patent system. The goal of this project was to assist the USPTO by evaluating their current quality metrics on patent examinations. To analyze the quality metrics, our team collected data through an analysis of external and internal surveys, annual reports, focus groups, and employee interviews. Our team identified key quality issues and made recommendations for the development of new metrics to monitor quality improvement.