USPTO Quality Metrics Analysis
Authors
Olivia S. Bennett, Elora V. Borkowski, Arthur J. Fulgoni, Andrew J. Weiler
Sponsor
United States Patent and Trademark Office
Advisors
James Hanlan, Paul Davis
Term
October – December 2014
Project Outcomes
Abstract
The United States Patent and Trademark Office is working to improve its position as a “world-class” patent system. The goal of this project was to assist the USPTO by evaluating their current quality metrics on patent examinations. To analyze the quality metrics, our team collected data through an analysis of external and internal surveys, annual reports, focus groups, and employee interviews. Our team identified key quality issues and made recommendations for the development of new metrics to monitor quality improvement.